M. Ohbitsu, T. Yokoi, Y. Noda, E. Kamiyama, T. Ushiro, H. Nagaoka, K. Sueoka, K. Matsunaga, “Atomic structures and stability of finite-size extended interstitial defects in silicon: Large-scale molecular simulations with a neural-network potential”, Scripta Materialia, 214 (2022) 114650