Satoko Toyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata,, “Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM,”, Ultramicroscopy, 238 (2022) 113538.

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Satoko Toyama, Takehito Seki, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya, Yuichi Ikuhara, Naoya Shibata,, “Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM,”, Ultramicroscopy, 238 (2022) 113538.